NanoXtract: Nanomaterials Image Analysis Tool Powered by Enalos Cloud Platform

User Guide

Step

Image

Image upload

Please select an image

NM type

Comp. Branches

Activate Capture

Measuered length (nm)

Line length (pixels)

pxls/nm ratio

Reduction of noise

X dimension sigma

Y dimension sigma

Thresholding

Method

Threshold Value

Labeling improvement

Distance Merge Threshold

Gauss Size

Size Merge Threshold

Filtering

Minimum Segment Area (pixels)

Maximum Segment Area (pixels)

Statistically processed image end result

Automatically remove outliers

Description

Values

Standard Deviation

*This work project has received funding from European Union Horizon 2020 Programme (H2020) via NanoCommons research infrastructure project under grant agreement nº 731032